Applied Sciences, Vol. 15, Pages 9715: Multi-Scale Electromechanical Impedance-Based Bolt Loosening Identification Using Attention-Enhanced Parallel CNN
Applied Sciences doi: 10.3390/app15179715
Authors:
Xingyu Fan
Jiaming Kong
Haoyang Wang
Kexin Huang
Tong Zhao
Lu Li
Bolted connections are extensively utilized in aerospace, civil, and mechanical systems for structural assembly. However, inevitable structural vibrations can induce bolt loosening, leading to preload reduction and potential structural failure. Early-stage preload degradation, particularly during initial loosening, is often undetectable by conventional monitoring methods due to limited sensitivity and poor noise resilience. To address these limitations, this study proposes an intelligent bolt preload monitoring framework that combines electromechanical impedance (EMI) signal analysis with a parallel deep learning architecture. A multiphysics-coupled model of flange joint connections is developed to reveal the nonlinear relationships between preload degradation and changes in EMI conductance spectra, specifically resonance peak shifts and amplitude attenuation. Based on this insight, a parallel convolutional neural network (P-CNN) is designed, employing dual branches with 1 × 3 and 1 × 7 convolutional kernels to extract local and global spectral features, respectively. The architecture integrates dilated convolution to expand frequency–domain receptive fields and an enhanced SENet-based channel attention mechanism to adaptively highlight informative frequency bands. Experimental validation on a flange-bolt platform demonstrates that the proposed P-CNN achieves 99.86% classification accuracy, outperforming traditional CNNs by 20.65%. Moreover, the model maintains over 95% accuracy with only 25% of the original training samples, confirming its robustness and data efficiency. The results demonstrate the feasibility and scalability of the proposed approach for real-time, small-sample, and noise-resilient structural health monitoring of bolted connections.
Source link
Xingyu Fan www.mdpi.com
