Photonics, Vol. 12, Pages 617: Advances in Optical Metrology: High-Bandwidth Digital Holography for Transparent Objects Analysis

Photonics doi: 10.3390/photonics12060617

Authors:
Manoj Kumar
Lavlesh Pensia
Karmjit Kaur
Raj Kumar
Yasuhiro Awatsuji
Osamu Matoba

Accurate and non-invasive optical metrology of transparent objects is essential in several commercial and research applications, from fluid dynamics to biomedical imaging. In this work, a digital holography approach for thickness measurement of glass plate and temperature mapping of candle flame is presented that leverages a double-field-of-view (FOV) configuration combined with high spatial bandwidth utilization (SBU). By capturing a multiplexed hologram from two distinct objects in a single shot, the system overcomes the limitations inherent to single-view holography, enabling more comprehensive object information of thickness measurement and temperature-induced refractive index variations. The method integrates double-FOV digital holography with high SBU, allowing for accurate surface profiling and mapping of complex optical path length changes caused by temperature gradients. The technique exhibits strong potential for applications in the glass industry and microfluidic thermometry, convection analysis, and combustion diagnostics, where precise thermal field measurements are crucial. This study introduces an efficient holographic framework that advances the capabilities of non-contact measurement applications by integrating double-FOV acquisition into a single shot with enhanced spatial bandwidth exploitation. The approach sets the groundwork for real-time, volumetric thermal imaging and expands the applicability of digital holography in both research and industrial settings.

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