Sensors, Vol. 26, Pages 1373: MambaVSS-YOLOv11n: State Space Model-Enhanced Multi-Defect Detection in Photovoltaic Module Electroluminescence Images
Sensors doi: 10.3390/s26041373
Authors:
Kun Wang
Yixin Tang
Xu Wang
Nan Yang
Ziqi Han
Fuzhong Li
Guozhu Song
Given the rising global demand for environmentally sustainable energy sources, solar photovoltaic (PV) power generation has emerged as a pivotal component of the energy transition. In PV systems, power conversion efficiency is degraded and operational lifespan reduced due to the presence of defective modules. Consequently, achieving accurate and efficient defect detection during PV module manufacturing is critical to ensuring product quality and reliability. To address this challenge, we propose MambaVSS-YOLOv11n, an electroluminescence (EL) image-based multi-defect detection method for PV modules. Our study utilizes a dataset containing six types of defects—Broken Gate, Cold Solder Joint, Black Spot, Scratch, Microcrack, and Suction Mark—to construct 692 labeled EL images of defective PV modules. The model integrates the Vision State Space (VSS) module from Mamba and optimizes the C3k2 Bottleneck structure to enhance fine-grained feature extraction, while employing Space-to-Depth Convolutional (SPD-Conv) Layer for downsampling to improve computational efficiency. Additionally, to address YOLOv11n’s limited generalization capability for small objects and complex backgrounds, we adopt the Inner Mask Distance Penalized Intersection over the Union (Inner-MDPIoU) loss function, which enhances detection accuracy and mitigates the impact of low-quality samples. Experimental results demonstrate that compared to YOLOv11n, MambaVSS-YOLOv11n reduces the number of parameters by 18.1%, while improving mAP@0.5 to 0.869 and mAP@0.5:0.95 to 0.637. This achieves model lightweighting while enhancing detection performance. These findings indicate that the model is well-suited for real-time defect detection in PV module production lines, providing PV manufacturers with a lightweight yet accurate and reliable solution for PV module defect inspection.
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Kun Wang www.mdpi.com
